[1]
Poobalan, B., Hashim, N.S., Natarajan, M. and Rahim, A.F.A. 2024. Wide Bandgap SiC-Based Oxide Thickness Optimization by Computation and Simulation using Enhanced Electron Mobility with Regulated Gate Voltage Technique for High-Power 4H-SiC MOSFET. Journal of Engineering and Technological Sciences. 56, 3 (Jun. 2024), 367–376. DOI:https://doi.org/10.5614/j.eng.technol.sci.2024.56.3.5.